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X-ray reflectometry & GIXD study of growth of mesporous silicate/titanate films at the air-water interface; & Reflectometry & grazing incidence diffraction studies of evaporation retarding monolayers
X-ray reflectometry & GIXD study of growth of mesporous silicate/titanate films at the air-water interface; & Reflectometry & grazing incidence diffraction studies of evaporation retarding monolayers (2008)
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Professor Ian Gentle
Professor
School of Chemistry and Molecular Biosciences
Faculty of Science
Ian Gentle
