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1999 Conference Publication Continuous optimization using elite genetic algorithms with adaptive mutationsDjurisic, A. B., Rakic, A., Li, E. H., Majewski, M. L., Bundaleski, N. and Stanic, B. V. (1999). Continuous optimization using elite genetic algorithms with adaptive mutations. Simulated Evolution and Learning, 1998, Camberra, November, 1998. Berlin: Springer. doi: 10.1007/3-540-48873-1_47 |
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1996 Conference Publication The effect of broadening on the optical dielectric function of GaAs and AlAsRakic, AD, Majewski, ML and Cohen, MI (1996). The effect of broadening on the optical dielectric function of GaAs and AlAs. 1996 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 9), Canberra Australia, Dec 08-11, 1996. NEW YORK: I E E E. doi: 10.1109/COMMAD.1996.610134 |
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1996 Conference Publication Phase retrieval methods for the determination of transverse mode structure in vertical-cavity surface-emitting lasersCohen, M. I., Rakic, A. D. and Majewski, M. L. (1996). Phase retrieval methods for the determination of transverse mode structure in vertical-cavity surface-emitting lasers. 1996 Conference on Optoelectronic and Microelectronic Materials and Devices (COMMAD 9), Canberra Australia, 8-11 December 1996. NEW YORK: I E E E. doi: 10.1109/COMMAD.1996.610070 |
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1996 Conference Publication Effect of broadening on the optical dielectric function of GaAs and AlAsRakic, A. D., Majewski, M. L. and Cohen, M. I. (1996). Effect of broadening on the optical dielectric function of GaAs and AlAs. 1996 Conference on Optoelectronic and Microelectronic Materials and Devices, Canberra, ACT, Australia, 8-11 December 1996. Piscataway, NJ, United States: IEEE. doi: 10.1109/COMMAD.1996.610134 |
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1995 Conference Publication Determination of the optical constants of noble metals using simulated annealing procedure with acceptance-probability controlDurisic, Aleksandra B., Rakic, Aleksandar D. and Elazar, Jovan M. (1995). Determination of the optical constants of noble metals using simulated annealing procedure with acceptance-probability control. IEEE. |
