An Integrated Raman Microscope and in situ STM-TEM Analysis System (2008-2009)
Abstract
The proposed Raman microscope integrated with scanning electron microscopy (SEM) and a structural and chemical analyser will be an outstanding characterisation system for a wide range of materials, capable of structural, elemental, morphological, and physical characterization of the same sample region under precisely controlled conditions. The in-situ TEM holder will allow in-situ STM sample characterisations that will provide invaluable information on electrical properties and dynamic processes at specific locations. As a coordinated facility, these instruments represent a comprehensive characterisation tool underpinning the work of excellent researchers in advanced nano-materials, polymers, and biological systems.
