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2023 Conference Publication Prediction of adverse Neurodevelopmental Outcomes in a state-wide Early Detection Network (QEDIN-CP)Luke, Carly, McNamara, Lynda, Carlton, Morgan, Finn, Christine, Gibson, Sarah, Morris, Kym, Shannon, Bernadette, Oakes, Ellena, Gordon, Anya, Thomas, Rachel, George, Joanne, Kentish, Megan, Ware, Robert S. and Boyd, Roslyn N. (2023). Prediction of adverse Neurodevelopmental Outcomes in a state-wide Early Detection Network (QEDIN-CP). American Academy of Cerebral Palsy and Developmental Medicine, Chicago, IL, United States, 10-13 September 2023. Chichester, West Sussex, United Kingdom: Wiley-Blackwell. |
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2021 Conference Publication HD-EEG spectra in 6-year-old children born prematurelyNguyen, Courtney, Iyer, Kartik, George, Joanne, Pagnozzi, Alex, Bora, Samudragupta, Colditz, Paul and Barlow, Karen (2021). HD-EEG spectra in 6-year-old children born prematurely. AAN 73rd Annual Meeting, Online, 17-22 April 2021. Philadelphia, PA United States: Wolters Kluwer. doi: 10.1212/wnl.96.15_supplement.2043 |
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2018 Conference Publication Investigating brain age deviation in preterm infants: a deep learning approachSaha, Susmita, Pagnozzi, Alex, George, Joanne, Colditz, Paul B., Boyd, Roslyn, Rose, Stephen, Fripp, Jurgen and Pannek, Kerstin (2018). Investigating brain age deviation in preterm infants: a deep learning approach. First International Workshop DATRA 2018 and Third International Workshop PIPPI 2018, Held in Conjunction with MICCAI 2018, Granada, Spain, 16 September 2018. Cham, Switzerland: Springer. doi: 10.1007/978-3-030-00807-9_9 |
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2017 Conference Publication A spatio-temporal atlas of neonatal diffusion MRI based on kernel ridge regressionShen, Kaikai, Fripp, Jurgen, Pannek, Kerstin, George, Joanne, Colditz, Paul, Boyd, Roslyn and Rose, Stephen (2017). A spatio-temporal atlas of neonatal diffusion MRI based on kernel ridge regression. 14th IEEE International Symposium on Biomedical Imaging, ISBI 2017, Melbourne, VIC, Australia, 18 - 21 April 2017. Piscataway, NJ, United States: Institute of Electrical and Electronics Engineers. doi: 10.1109/ISBI.2017.7950484 |
