Skip to menu Skip to content Skip to footer

1993

Journal Article

Misfit dislocations and critical thickness in InGaAs/GaAs heterostructure systems

Zou, J, Cockayne, Djh and Usher, BF (1993). Misfit dislocations and critical thickness in InGaAs/GaAs heterostructure systems. Journal of Applied Physics, 73 (2), 619-626. doi: 10.1063/1.353372

Misfit dislocations and critical thickness in InGaAs/GaAs heterostructure systems

1992

Journal Article

An electron diffraction and microscopy investigation of quasi-periodic Ta-Al superlattices

Jiang, S. S., Zou, J., Cockayne, D. J. H., Sikorski, A., Hu, A and Peng, R. W. (1992). An electron diffraction and microscopy investigation of quasi-periodic Ta-Al superlattices. Philosophical Magazine B, 66 (2), 229-237. doi: 10.1080/13642819208224586

An electron diffraction and microscopy investigation of quasi-periodic Ta-Al superlattices

1992

Journal Article

Microstructural observations of Ta/Al superlattices by TEM

Jiang, SS, Zou, J, Cockayne, Djh, Sikorski, A, Hu, A and Peng, RW (1992). Microstructural observations of Ta/Al superlattices by TEM. Physica Status Solidi. A: Applications and Materials Science, 130 (2), 373-381. doi: 10.1002/pssa.2211300214

Microstructural observations of Ta/Al superlattices by TEM

1992

Journal Article

Transmission electron microscopy investigations of misfit dislocation interactions in GaAs/InGaAs superlattices on GaAs (001) substrates

Jin, Zou, Shusheng, Jiang, Cockayne, D. J.H., Yunwu, Zhang, Xiang, Guo and Zhengfu, Peng (1992). Transmission electron microscopy investigations of misfit dislocation interactions in GaAs/InGaAs superlattices on GaAs (001) substrates. Chinese Physics Letters, 9 (7), 367-370. doi: 10.1088/0256-307x/9/7/009

Transmission electron microscopy investigations of misfit dislocation interactions in GaAs/InGaAs superlattices on GaAs (001) substrates

1991

Journal Article

Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy

Zou, J., Usher, B. F., Cockayne, D. J.H. and Glaisher, R. (1991). Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy. Journal of Electronic Materials, 20 (10), 855-859.

Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy

1988

Journal Article

Twin structures, transformation and symmetry of superconducting Y1Ba2Cu3O7-x, observed by transmission electron microscopy

Zou, J., Cockayne, D. J. H., Auchterlonie, G. J., McKenzie, D. R., Dou, S. X., Bourdillon, A. J., Sorrell, C. C., Easterling, K. E. and Johnson, A. W. S. (1988). Twin structures, transformation and symmetry of superconducting Y1Ba2Cu3O7-x, observed by transmission electron microscopy. Philosophical Magazine Letters, 57 (3), 157-163. doi: 10.1080/09500838808203765

Twin structures, transformation and symmetry of superconducting Y1Ba2Cu3O7-x, observed by transmission electron microscopy

1988

Journal Article

A transmission electron-microscopy study on metastable phases in the li2o-tio2 system

Zou, J., Li, F.H., Yang, D.Y., Jiang, Y.D. and Kuo, K.H. (1988). A transmission electron-microscopy study on metastable phases in the li2o-tio2 system. Philosophical Magazine B-physics of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties, 57 (1), 103-110. doi: 10.1080/13642818808205726

A transmission electron-microscopy study on metastable phases in the li2o-tio2 system

1986

Journal Article

Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+

Tang, D., Teng, C.M., Zou, J. and Li, F. H. (1986). Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+. Acta Crystallographica. Section B: Structural Science, 42 (4), 340-342. doi: 10.1107/S0108768186098130

Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+