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2000

Journal Article

Damage buildup in GaN under ion bombardment

Kucheyev, SO, Williams, JS, Jagadish, C, Zou, J and Li, G (2000). Damage buildup in GaN under ion bombardment. Physical Review B, 62 (11), 7510-7522. doi: 10.1103/PhysRevB.62.7510

Damage buildup in GaN under ion bombardment

2000

Journal Article

Investigation of AlGaAs/GaAs V-grooved quantum wire infrared photodetector structures

Liu, XQ, Li, N, Li, ZF, Lu, W, Shen, SC, Fu, Y, Willander, M, Tan, HH, Jagadish, C and Zou, J (2000). Investigation of AlGaAs/GaAs V-grooved quantum wire infrared photodetector structures. Japanese Journal of Applied Physics Part 1-Regular Papers Short Notes & Review Papers, 39 (9A), 5124-5127. doi: 10.1143/JJAP.39.5124

Investigation of AlGaAs/GaAs V-grooved quantum wire infrared photodetector structures

2000

Journal Article

Composition and its impact on shape evolution in dislocated Ge(Si)/Si islands

Liao, X. Z., Zou, J., Cockayne, D. J. H., Jiang, Z. M., Wang, X. and Leon, R. (2000). Composition and its impact on shape evolution in dislocated Ge(Si)/Si islands. Applied Physics Letters, 77 (9), 1304-1306. doi: 10.1063/1.1290384

Composition and its impact on shape evolution in dislocated Ge(Si)/Si islands

2000

Journal Article

Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon

Wong-Leung, J, Fatima, S, Jagadish, C, Fitz Gerald, JD, Chou, CT, Zou, J and Cockayne, DJH (2000). Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon. Journal of Applied Physics, 88 (3), 1312-1318. doi: 10.1063/1.373819

Transmission electron microscopy characterization of secondary defects created by MeV Si, Ge, and Sn implantation in silicon

2000

Journal Article

Investigation of threading dislocation blocking in strained-layer InGaAs/GaAs heterostructures using scanning cathodoluminescence microscopy

Russell, JJ, Zou, J, Moon, AR and Cockayne, DJH (2000). Investigation of threading dislocation blocking in strained-layer InGaAs/GaAs heterostructures using scanning cathodoluminescence microscopy. Journal of Applied Physics, 88 (3), 1307-1311. doi: 10.1063/1.373818

Investigation of threading dislocation blocking in strained-layer InGaAs/GaAs heterostructures using scanning cathodoluminescence microscopy

2000

Journal Article

Carrier capture and relaxation in Stranski-Krastanow InxGa1-xAs/GaAs(311)B quantum dots

Lobo, C, Perret, N, Morris, D, Zou, J, Cockayne, DJH, Johnston, MB, Gal, M and Leon, R (2000). Carrier capture and relaxation in Stranski-Krastanow InxGa1-xAs/GaAs(311)B quantum dots. Physical Review B, 62 (4), 2737-2742. doi: 10.1103/PhysRevB.62.2737

Carrier capture and relaxation in Stranski-Krastanow InxGa1-xAs/GaAs(311)B quantum dots

2000

Journal Article

Adatom condensation and quantum dot sizes in InGaAs/GaAs (001)

Leon, R., Wellman, J., Liao, X. Z., Zou, J. and Cockayne, D. J. H. (2000). Adatom condensation and quantum dot sizes in InGaAs/GaAs (001). Applied Physics Letters, 76 (12), 1558-1560. doi: 10.1063/1.126095

Adatom condensation and quantum dot sizes in InGaAs/GaAs (001)

2000

Journal Article

Strain effect in a GaAs-In0.25Ga0.75As-Al0.5Ga0.5As asymmetric quantum wire

Fu, Y, Willander, M, Lu, W, Liu, XQ, Shen, SC, Jagadish, C, Gal, M, Zou, J and Cockayne, DJH (2000). Strain effect in a GaAs-In0.25Ga0.75As-Al0.5Ga0.5As asymmetric quantum wire. Physical Review B, 61 (12), 8306-8311. doi: 10.1103/PhysRevB.61.8306

Strain effect in a GaAs-In0.25Ga0.75As-Al0.5Ga0.5As asymmetric quantum wire

2000

Journal Article

Wavelength shifting of adjacent quantum wells in V-groove quantum wire structure by selective implantation and annealing

Liu, XQ, Lu, W, Chen, XS, Shen, SC, Tan, HH, Yuan, S, Jagadish, C, Johnston, MB, Dao, LV, Gal, M, Zou, J and Cockayne, DJH (2000). Wavelength shifting of adjacent quantum wells in V-groove quantum wire structure by selective implantation and annealing. Journal of Applied Physics, 87 (3), 1566-1568. doi: 10.1063/1.372051

Wavelength shifting of adjacent quantum wells in V-groove quantum wire structure by selective implantation and annealing

2000

Journal Article

Surface disordering and nitrogen loss in GaN under ion bombardment

Kucheyev, S. O., Williams, J. S., Jagadish, C., Zou, J., Toth, M., Phillips, M. R., Tan, H. H., Li, G. and Pearton, S. J. (2000). Surface disordering and nitrogen loss in GaN under ion bombardment. Materials Research Society Symposium-Proceedings, 622, T791-T796.

Surface disordering and nitrogen loss in GaN under ion bombardment

1999

Journal Article

Inhibited carrier transfer in ensembles of isolated quantum dots

Lobo, C, Leon, R, Marcinkevicius, S, Yang, W, Sercel, PC, Liao, XZ, Zou, J and Cockayne, DJH (1999). Inhibited carrier transfer in ensembles of isolated quantum dots. Physical Review B, 60 (24), 16647-16651. doi: 10.1103/PhysRevB.60.16647

Inhibited carrier transfer in ensembles of isolated quantum dots

1999

Journal Article

Strain relaxation by alloying effects in Ge islands grown on Si(001)

Liao, XZ, Zou, J, Cockayne, DJH, Qin, J, Jiang, ZM, Wang, X and Leon, R (1999). Strain relaxation by alloying effects in Ge islands grown on Si(001). Physical Review B, 60 (23), 15605-15608. doi: 10.1103/PhysRevB.60.15605

Strain relaxation by alloying effects in Ge islands grown on Si(001)

1999

Journal Article

Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing

Liu, X. Q., Lu, W., Li, Z. F., Chen, Y. D., Shen, S. C., Fu, Y., Willander, M., Tan, H. H., Yuan, S., Jagadish, C., Zou, J. and Cockayne, D. J. H. (1999). Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing. Applied Physics Letters, 75 (21), 3339-3341. doi: 10.1063/1.125344

Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing

1999

Journal Article

Role of implantation-induced defects on the response time of semiconductor saturable absorbers

Tan, H. H., Jagadish, C., Lederer, M. J., Luther-Davies, B., Zou, J., Cockayne, D. J. H., Haiml, M., Siegner, U. and Keller, U. (1999). Role of implantation-induced defects on the response time of semiconductor saturable absorbers. Applied Physics Letters, 75 (10), 1437-1439. doi: 10.1063/1.124718

Role of implantation-induced defects on the response time of semiconductor saturable absorbers

1999

Journal Article

Ensemble interactions in strained semiconductor quantum dots

Leon, R, Marcinkevicius, S, Liao, XZ, Zou, J, Cockayne, DJH and Fafard, S (1999). Ensemble interactions in strained semiconductor quantum dots. Physical Review B, 60 (12), R8517-R8520. doi: 10.1103/PhysRevB.60.R8517

Ensemble interactions in strained semiconductor quantum dots

1999

Journal Article

Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots

Liao, XZ, Zou, J, Cockayne, DJH, Leon, R and Lobo, C (1999). Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots. Physical Review Letters, 82 (25), 5148-5151. doi: 10.1103/PhysRevLett.82.5148

Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots

1999

Journal Article

Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate

Zou, J, Liao, XZ, Cockayne, DJH and Leon, R (1999). Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate. Physical Review B, 59 (19), 12279-12282. doi: 10.1103/PhysRevB.59.12279

Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate

1999

Journal Article

Dislocation-induced changes in quantum dots: step alignment and radiative emission

Leon, R., Okuno, J. O., Lawton, R. A., Stevens-Kalceff, M., Phillips, M. R., Zou, J., Cockayne, D. J. H. and Lobo, C. (1999). Dislocation-induced changes in quantum dots: step alignment and radiative emission. Applied Physics Letters, 74 (16), 2301-2303. doi: 10.1063/1.123831

Dislocation-induced changes in quantum dots: step alignment and radiative emission

1999

Journal Article

Depth profiling of GaN by cathodoluminescence microanalysis

Fleischer, K., Toth, M., Phillips, M. R., Zou, J., Li, G. and Chua, S. J. (1999). Depth profiling of GaN by cathodoluminescence microanalysis. Applied Physics Letters, 74 (8), 1114-1116. doi: 10.1063/1.123460

Depth profiling of GaN by cathodoluminescence microanalysis

1999

Journal Article

Nonlinear optical properties of ion-implanted GaAs

Lederer, M. J., Luther-Davies, B., Tan, H. H., Jagadish, C., Haiml, M., Siegner, U., Keller, U. and Zou, J. (1999). Nonlinear optical properties of ion-implanted GaAs. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD, 151-153.

Nonlinear optical properties of ion-implanted GaAs