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2004

Journal Article

Atomistic structure of monocrystalline silicon in surface nano-modification

Zarudi, I, Cheong, WCD, Zou, J and Zhang, LC (2004). Atomistic structure of monocrystalline silicon in surface nano-modification. Nanotechnology, 15 (1), 104-107. doi: 10.1088/0957-4484/15/1/020

Atomistic structure of monocrystalline silicon in surface nano-modification

2004

Journal Article

The R8-BC8 phases and crystal growth in monocrystalline silicon under microindentation with a spherical indenter

Zarudi, I, Zhang, LC, Zou, J and Vodenitcharova, T (2004). The R8-BC8 phases and crystal growth in monocrystalline silicon under microindentation with a spherical indenter. Journal of Materials Research, 19 (1), 332-337. doi: 10.1557/jmr.2004.19.1.332

The R8-BC8 phases and crystal growth in monocrystalline silicon under microindentation with a spherical indenter

2004

Conference Publication

Towards p-Type Doping of ZnO by Ion Implantation

Coleman, V. A., Tan, H. H., Jagadish, C., Kucheyev, S. O., Phillips, M. R. and Zou, Jin (2004). Towards p-Type Doping of ZnO by Ion Implantation. Materials Research Society 2004 Fall Meeting (MRS), Boston, 29 Nov - 3 Dec 2004. Materials Research Society.

Towards p-Type Doping of ZnO by Ion Implantation

2004

Journal Article

Lattice damage produced in GaN by swift heavy ions

Kucheyev, S. O., Timmers, H., Zou, J., Williams, J. S., Jagadish, C. and Li, G. (2004). Lattice damage produced in GaN by swift heavy ions. Journal of Applied Physics, 95 (10), 5360-5365. doi: 10.1063/1.1703826

Lattice damage produced in GaN by swift heavy ions

2004

Conference Publication

Lattice Disorder Produced in GaN by Irradation with Swift Heavy Ions

Kucheyev, S. O., Timmers, H., Zou, J., Williams, J. S., Jagadish, C. and Li, G. (2004). Lattice Disorder Produced in GaN by Irradation with Swift Heavy Ions. 14th International Conference on Ion Beam Modification of Materials (IBMM 2004), Monterey, California, USA, 5–10 September, 2004.

Lattice Disorder Produced in GaN by Irradation with Swift Heavy Ions

2004

Journal Article

Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM

Wang, D., Zou, J., He, W. Z., Chen, H., Li, F. H., Kawasaki, K. and Oikawa, T. (2004). Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM. Ultramicroscopy, 98 (2-4), 259-264. doi: 10.1016/j.ultramic.2003.08.019

Determination of a misfit dislocation complex in SiGe/Si heterostructures by image deconvolution technique in HREM

2004

Journal Article

Dynamic annealing in III-nitrides under ion bombardment

Kucheyev, SO, Williams, JS, Zou, J and Jagadish, C (2004). Dynamic annealing in III-nitrides under ion bombardment. Journal of Applied Physics, 95 (6), 3048-3054. doi: 10.1063/1.1649459

Dynamic annealing in III-nitrides under ion bombardment

2004

Edited Outputs

Ultramicroscopy

Ultramicroscopy. (2004). 98 (1-2)

Ultramicroscopy

2004

Journal Article

Enhanced optical properties of the GaAsN/GaAs quantum-well structure by the insertion of InAs monolayers

Gao, Q., Tan, H.H., Jagadish, C., Sun, B.Q., Gal, M., Ouyang, L. and Zou, J. (2004). Enhanced optical properties of the GaAsN/GaAs quantum-well structure by the insertion of InAs monolayers. Applied Physics Letters, 84 (14), 2536-2538. doi: 10.1063/1.1697628

Enhanced optical properties of the GaAsN/GaAs quantum-well structure by the insertion of InAs monolayers

2004

Journal Article

Boron nitride nanotubes: Pronounced resistance to oxidation

Chen, Y, Zou, J, Campbell, SJ and Le Caer, G (2004). Boron nitride nanotubes: Pronounced resistance to oxidation. Applied Physics Letters, 84 (13), 2430-2432. doi: 10.1063/1.1667278

Boron nitride nanotubes: Pronounced resistance to oxidation

2004

Journal Article

Dimerlike positional correlation and resonant transmission of electromagnetic waves in aperiodic dielectric multilayers

Peng, R. W., Liu, Y. M., Huang, X. Q., Qiu, F., Wang, M., Hu, A., Jiang, S. S., Feng, D., Ouyang, L. Z. and Zou, J. (2004). Dimerlike positional correlation and resonant transmission of electromagnetic waves in aperiodic dielectric multilayers. Physical Review B, 69 (16) 165109, 165109-1-165109-7. doi: 10.1103/PhysRevB.69.165109

Dimerlike positional correlation and resonant transmission of electromagnetic waves in aperiodic dielectric multilayers

2004

Conference Publication

Nanoanalysis of novel dopants in oxygen ion conductors

Auchterlonie, G.J., Drennan, J. and Zou, J. (2004). Nanoanalysis of novel dopants in oxygen ion conductors. ACEM-18, Geelong, Australia, 31 January- 6 February 2004.

Nanoanalysis of novel dopants in oxygen ion conductors

2004

Journal Article

Structural, electrical, and optical analysis of ion implanted semi-insulating InP

Carmody, C, Tan, HH, Jagadish, C, Douheret, O, Maknys, K, Anand, S, Zou, J, Dao, L and Gal, M (2004). Structural, electrical, and optical analysis of ion implanted semi-insulating InP. Journal of Applied Physics, 95 (2), 477-482. doi: 10.1063/1.1633349

Structural, electrical, and optical analysis of ion implanted semi-insulating InP

2004

Journal Article

Microstructure of MmM(5)/Mg multi-layer hydrogen storage films prepared by magnetron sputtering

Ouyang, LZ, Wang, H, Zhu, M, Zou, J and Chung, CY (2004). Microstructure of MmM(5)/Mg multi-layer hydrogen storage films prepared by magnetron sputtering. Microscopy Research And Technique, 64 (4), 323-329. doi: 10.1002/jemt.20089

Microstructure of MmM(5)/Mg multi-layer hydrogen storage films prepared by magnetron sputtering

2004

Journal Article

[0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1): Dedicated to Professor Fang-hua Li on the occasion of her 70th birthday

Liao, X. Z., Zou, J., Cockayne, D. J. H. and Matsumura, S. (2004). [0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1): Dedicated to Professor Fang-hua Li on the occasion of her 70th birthday. Ultramicroscopy, 98 (2-4), 239-247. doi: 10.1016/j.ultramic.2003.08.017

[0 0 1] zone-axis bright-field diffraction contrast from coherent Ge(Si) islands on Si(0 0 1): Dedicated to Professor Fang-hua Li on the occasion of her 70th birthday

2003

Journal Article

Microstructures of phases in indented silicon: A high resolution characterization

Zarudi, I, Zou, J and Zhang, LC (2003). Microstructures of phases in indented silicon: A high resolution characterization. Applied Physics Letters, 82 (6), 874-876. doi: 10.1063/1.1544429

Microstructures of phases in indented silicon: A high resolution characterization

2003

Conference Publication

Dynamic annealing in group-III nitrides under ion irradiation

Kucheyev, S. O., Williams, J. S., Jagadish, C. and Zou, J. (2003). Dynamic annealing in group-III nitrides under ion irradiation. Symposium R:Radiation Effects and Ion Beam Processing of Materials, Boston, MA, 1 - 5 December, 2003.

Dynamic annealing in group-III nitrides under ion irradiation

2003

Conference Publication

Ion implantation of ZnO: opportunities and challenges

Kucheyev, S. O., Williams, J. S., Jagadish, C., Zou, J., Evans, C., Nelson, A. J., Hamza, A. V. and Livermore, Laurence (2003). Ion implantation of ZnO: opportunities and challenges. Symposium Z: Progress in Compound Semiconductor Materials III - Electronic and Optoelectronic Applications, Boston, MA, 1 - 5 Decmeber, 2003.

Ion implantation of ZnO: opportunities and challenges

2003

Journal Article

Epitaxially grown GaAsN random laser

Sun, BQ, Gal, M, Gao, Q, Tan, HH, Jagadish, C, Puzzer, T, Ouyang, L and Zou, J (2003). Epitaxially grown GaAsN random laser. Journal of Applied Physics, 93 (10), 5855-5858. doi: 10.1063/1.1568533

Epitaxially grown GaAsN random laser

2003

Conference Publication

Atomic level structural modification in mono-crystalline silicon during nano-machining

Zarudi, I., Cheong, W. C. D., Zou, J. and Zhang, L. C. (2003). Atomic level structural modification in mono-crystalline silicon during nano-machining. Intelligent Processing and Manufacturing of Material, Sendai, Japan, 18-23 May 2003.

Atomic level structural modification in mono-crystalline silicon during nano-machining