|
2003 Conference Publication Dynamic annealing in group-III nitrides under ion irradiationKucheyev, S. O., Williams, J. S., Jagadish, C. and Zou, J. (2003). Dynamic annealing in group-III nitrides under ion irradiation. Symposium R:Radiation Effects and Ion Beam Processing of Materials, Boston, MA, 1 - 5 December, 2003. |
|
2003 Conference Publication Ion implantation of ZnO: opportunities and challengesKucheyev, S. O., Williams, J. S., Jagadish, C., Zou, J., Evans, C., Nelson, A. J., Hamza, A. V. and Livermore, Laurence (2003). Ion implantation of ZnO: opportunities and challenges. Symposium Z: Progress in Compound Semiconductor Materials III - Electronic and Optoelectronic Applications, Boston, MA, 1 - 5 Decmeber, 2003. |
|
2003 Conference Publication Strain relaxation in self-assembled Ge(Si)/Si quantum dotsZou, J., Liao, X. Z., Cockayne, D.J.H. and Jiang, Z. M. (2003). Strain relaxation in self-assembled Ge(Si)/Si quantum dots. Advanced Nanomaterials and Nanodevices, China, 10 - 14 June, 2002. |
|
2003 Journal Article Ion-beam-produced structural defects in ZnOKucheyev, S. O., Williams, J. S., Jagadish, C., Zou, J., Evans, C., Nelson, A. J. and Hamza, A. V. (2003). Ion-beam-produced structural defects in ZnO. Physical Review B, 67 (9), 94115-1-94115-11. doi: 10.1103/PhysRevB.67.094115 |
|
2003 Conference Publication Exploring Nanomaterials Using Advanced Transmission Electron MicroscopyZou, J. (2003). Exploring Nanomaterials Using Advanced Transmission Electron Microscopy. Asia Pacific Nanotechnology Forum, Cairns, Australia, 19 - 21 November, 2003. N.J.: World Scientific. |
|
2003 Conference Publication Strain relaxation in epitaxial self-assembled Ge(Si)/Si islandsZou, J., Liao, X. Z. and Cockayne, D. J. H. (2003). Strain relaxation in epitaxial self-assembled Ge(Si)/Si islands. nternational Beijing Conference and Exhibition on Instrumental Analysis, Beijing, China, 13 - 16 October, 2003. |
|
2003 Conference Publication TEM investigations of the compositions in Ge(Si)/Si(001) quantum dotsLiao, X. Z., Zou, J. and Cockayne, D. J. H. (2003). TEM investigations of the compositions in Ge(Si)/Si(001) quantum dots. VII InterAmerican Congress on Electron Microscopy, San Antonio, Texas, 3 - 7 August, 2003. New York, N.Y. U.S.A.: Microscopy Society of America. doi: 10.1017/s143192760344213x |
|
2003 Journal Article Multilayered carbon films for tribological applicationsMcKenzie, DR, Tarrant, RN, Bilek, MMM, Ha, T, Zou, J, McBride, WE, Cockayne, DJH, Fujisawa, N, Swain, MV, James, NL, Woodard, JC and McCulloch, DG (2003). Multilayered carbon films for tribological applications. Diamond And Related Materials, 12 (2), 178-184. doi: 10.1016/S0925-9635(03)00020-7 |
|
2003 Conference Publication Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si IslandsZou, Jin, Liao, Xiaozhou, Cockayne, David J. H. and Jiang, Zuimin (2003). Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands. Cambridge University Press. doi: 10.1017/S1431927603442360 |
|
2003 Book Chapter Transmission electron microscopy investigation of semi conductor quantum dotsZou, J. and Liao, X. Z. (2003). Transmission electron microscopy investigation of semi conductor quantum dots. 透射电子显微学进展. (pp. 552-574) edited by Hengqiang Ye and Yuanming Wang. Bejing, China: Science Press. |
|
2003 Conference Publication Nature of planar defects in ion-implanted GaNZou, J., Wang, Y. G., Kucheyev, S. O., Williams, J. S., Jagadish, C. and Li, G. (2003). Nature of planar defects in ion-implanted GaN. The Internalional Beijing Conference and Exhibition on Instrumental Analysis (BCEIA), Beijing, China, 13- 16 October, 2003. Pennington, NJ: The Electrochemical Society. doi: 10.1149/1.1541257 |
|
2002 Journal Article Ion-beam-produced damage and its stability in AlN filmsKucheyev, SO, Williams, JS, Zou, J, Jagadish, C, Pophristic, M, Guo, S, Ferguson, IT and Manasreh, MO (2002). Ion-beam-produced damage and its stability in AlN films. Journal of Applied Physics, 92 (7), 3554-3558. doi: 10.1063/1.1501746 |
|
2002 Journal Article Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growthZou, J., Liao, X. Z., Cockayne, D. J. H. and Jiang, Z. M. (2002). Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growth. Applied Physics Letters, 81 (11), 1996-1998. doi: 10.1063/1.1506414 |
|
2002 Journal Article Structural disorder in ion-implanted AlxGa1-xNKucheyev, S. O., Williams, J. S., Zou, J., Li, G., Jagadish, C., Manasreh, M. O., Pophristic, M., Guo, S. and Ferguson, I. T. (2002). Structural disorder in ion-implanted AlxGa1-xN. Applied Physics Letters, 80 (5), 787-789. doi: 10.1063/1.1445478 |
|
2002 Journal Article Dislocation-induced spatial ordering of InAs quantum dots: Effects on optical propertiesLeon, R, Chaparro, S, Johnson, SR, Navarro, C, Jin, X, Zhang, YH, Siegert, J, Marcinkevicius, S, Liao, XZ and Zou, J (2002). Dislocation-induced spatial ordering of InAs quantum dots: Effects on optical properties. Journal of Applied Physics, 91 (9), 5826-5830. doi: 10.1063/1.1467963 |
|
2002 Conference Publication 314 HRTEM Studies of Plastic Deformation in Silicon Wafers due to Micro IndentationZarudi, I., Zou, J. and Zhang, L (2002). 314 HRTEM Studies of Plastic Deformation in Silicon Wafers due to Micro Indentation. Materials Processing, Honolulu, Hawaii, 14 - 18 October, 2002. |
|
2002 Conference Publication Growth and characterization of GaAsN epilayer and (In)GaAsN qutantum-well structureGao, Q., Tan, H. H., Jagadish, C., Sun, B. Q., Gal, M., Ouyang, L. and Zou, J. (2002). Growth and characterization of GaAsN epilayer and (In)GaAsN qutantum-well structure. Optoelectronic and Microelecttronic Materials and Devices, University of Sydney, NSW, Australia, 11 - 13 December, 2002. NEW YORK: Institute of Electrical and Electronics Engineers. doi: 10.1109/COMMAD.2002.1237238 |
|
2002 Conference Publication Composition distributions in Ge(Si)/Si(001) quantum dotsLiao, X. Z., Zou, J. and Cockayne, David J. H. (2002). Composition distributions in Ge(Si)/Si(001) quantum dots. 15th International Congress on Electron Microscopy (ICEM), Durban, South Africa, 1-6 September, 2002. |
|
2002 Journal Article Blistering of H-implanted GaNKucheyev, SO, Williams, JS, Jagadish, C, Zou, J and Li, G (2002). Blistering of H-implanted GaN. Journal of Applied Physics, 91 (6), 3928-3930. doi: 10.1063/1.1430533 |
|
2002 Journal Article Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imagingCai, DQ, Zou, J, Chen, GB, Lu, W, Chen, XS and Ringer, SP (2002). Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imaging. Scripta Materialia, 47 (4), 279-283. doi: 10.1016/S1359-6462(02)00144-6 |
