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2000

Conference Publication

Transmission electron microscopy investigation of semiconductor quantum dots

Liao, XZ, Zou, J and Cockayne, DJH (2000). Transmission electron microscopy investigation of semiconductor quantum dots. 11th International Semiconducting and Insulating Materials Conference (SIMC-XI), Canberra Australia, Jul 03-07, 2000. NEW YORK: IEEE. doi: 10.1109/SIM.2000.939230

Transmission electron microscopy investigation of semiconductor quantum dots

2000

Conference Publication

Ion implantation into GaN: Opportunities and problems

Kucheyev, SO, Williams, JS, Jagadish, C, Zou, J, Toth, M, Phillips, MR and Li, G (2000). Ion implantation into GaN: Opportunities and problems. 11th International Semiconducting and Insulating Materials Conference (SIMC-XI), Canberra Australia, Jul 03-07, 2000. NEW YORK: IEEE.

Ion implantation into GaN: Opportunities and problems

2000

Conference Publication

Composition distribution in Ge(Si) islands grown on Si (001) substrate

Zou, J., Liao, X. Z. and Cockayne, D. J. H. (2000). Composition distribution in Ge(Si) islands grown on Si (001) substrate. COMMAD 2002: Optoelectronic and Microelectronic Materials and Devices, Sydney, Australia, 11-13 December, 2000.

Composition distribution in Ge(Si) islands grown on Si (001) substrate

1999

Journal Article

Strain relaxation by alloying effects in Ge islands grown on Si(001)

Liao, XZ, Zou, J, Cockayne, DJH, Qin, J, Jiang, ZM, Wang, X and Leon, R (1999). Strain relaxation by alloying effects in Ge islands grown on Si(001). Physical Review B, 60 (23), 15605-15608. doi: 10.1103/PhysRevB.60.15605

Strain relaxation by alloying effects in Ge islands grown on Si(001)

1999

Journal Article

Inhibited carrier transfer in ensembles of isolated quantum dots

Lobo, C, Leon, R, Marcinkevicius, S, Yang, W, Sercel, PC, Liao, XZ, Zou, J and Cockayne, DJH (1999). Inhibited carrier transfer in ensembles of isolated quantum dots. Physical Review B, 60 (24), 16647-16651. doi: 10.1103/PhysRevB.60.16647

Inhibited carrier transfer in ensembles of isolated quantum dots

1999

Conference Publication

Island shape instabilities and surfactant-like effects in the growth of InGaAs/GaAs quantum dots

Leon, R, Lobo, C, Liao, XZ, Zou, J, Cockayne, DJH and Fafard, S (1999). Island shape instabilities and surfactant-like effects in the growth of InGaAs/GaAs quantum dots. Symposium on Growth Instabilities and Decomposit ion During Heteroepitaxy at the MRS Fall Meeting, Boston Massachusetts, Dec, 1998. LAUSANNE: Elsevier Sequoia SA. doi: 10.1016/S0040-6090(99)00472-1

Island shape instabilities and surfactant-like effects in the growth of InGaAs/GaAs quantum dots

1999

Journal Article

Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing

Liu, X. Q., Lu, W., Li, Z. F., Chen, Y. D., Shen, S. C., Fu, Y., Willander, M., Tan, H. H., Yuan, S., Jagadish, C., Zou, J. and Cockayne, D. J. H. (1999). Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing. Applied Physics Letters, 75 (21), 3339-3341. doi: 10.1063/1.125344

Spatially resolved luminescence investigation of AlGaAs/GaAs single quantum wires modified by selective implantation and annealing

1999

Journal Article

Role of implantation-induced defects on the response time of semiconductor saturable absorbers

Tan, H. H., Jagadish, C., Lederer, M. J., Luther-Davies, B., Zou, J., Cockayne, D. J. H., Haiml, M., Siegner, U. and Keller, U. (1999). Role of implantation-induced defects on the response time of semiconductor saturable absorbers. Applied Physics Letters, 75 (10), 1437-1439. doi: 10.1063/1.124718

Role of implantation-induced defects on the response time of semiconductor saturable absorbers

1999

Journal Article

Ensemble interactions in strained semiconductor quantum dots

Leon, R, Marcinkevicius, S, Liao, XZ, Zou, J, Cockayne, DJH and Fafard, S (1999). Ensemble interactions in strained semiconductor quantum dots. Physical Review B, 60 (12), R8517-R8520. doi: 10.1103/PhysRevB.60.R8517

Ensemble interactions in strained semiconductor quantum dots

1999

Journal Article

Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots

Liao, XZ, Zou, J, Cockayne, DJH, Leon, R and Lobo, C (1999). Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots. Physical Review Letters, 82 (25), 5148-5151. doi: 10.1103/PhysRevLett.82.5148

Indium segregation and enrichment in coherent InxGa1-xAs/GaAs quantum dots

1999

Journal Article

Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate

Zou, J, Liao, XZ, Cockayne, DJH and Leon, R (1999). Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate. Physical Review B, 59 (19), 12279-12282. doi: 10.1103/PhysRevB.59.12279

Transmission electron microscopy study of InxGa1-xAs quantum dots on a GaAs(001) substrate

1999

Journal Article

Dislocation-induced changes in quantum dots: step alignment and radiative emission

Leon, R., Okuno, J. O., Lawton, R. A., Stevens-Kalceff, M., Phillips, M. R., Zou, J., Cockayne, D. J. H. and Lobo, C. (1999). Dislocation-induced changes in quantum dots: step alignment and radiative emission. Applied Physics Letters, 74 (16), 2301-2303. doi: 10.1063/1.123831

Dislocation-induced changes in quantum dots: step alignment and radiative emission

1999

Journal Article

Depth profiling of GaN by cathodoluminescence microanalysis

Fleischer, K., Toth, M., Phillips, M. R., Zou, J., Li, G. and Chua, S. J. (1999). Depth profiling of GaN by cathodoluminescence microanalysis. Applied Physics Letters, 74 (8), 1114-1116. doi: 10.1063/1.123460

Depth profiling of GaN by cathodoluminescence microanalysis

1999

Journal Article

Transmission electron microscopy determination of quantum dot profile

Liao, X. Z., Zou, J., Duan, X. F., Cockayne, D. J.H., Leon, R. and Lobo, C. (1999). Transmission electron microscopy determination of quantum dot profile. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD, 106-108.

Transmission electron microscopy determination of quantum dot profile

1999

Journal Article

Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy

Russell-Harriott, J. J., Moon, A. R., Zou, J., Cockayne, D. J H and Usher, B. F. (1999). Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD, 287-289.

Investigation of oval defects in InGaAs/GaAs strained-layer heterostructures using cathodoluminescence and wavelength dispersive spectroscopy

1999

Journal Article

TEM measurement of Al profiles in interdiffused GaAs/AlGaAs quantum-wells

Zou, J., Cai, D. Q., Cockayne, D. J.H., Yuan, S. and Jagadish, C. (1999). TEM measurement of Al profiles in interdiffused GaAs/AlGaAs quantum-wells. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD, 358-360.

TEM measurement of Al profiles in interdiffused GaAs/AlGaAs quantum-wells

1999

Conference Publication

Transmission electron microscopy study of InGaAs/GaAs structural evolution near the Stranski-Krastanow transformation

Wellman, J, George, T, Leon, R, Fafard, S, Zou, J and Cockayne, DJH (1999). Transmission electron microscopy study of InGaAs/GaAs structural evolution near the Stranski-Krastanow transformation. Symposium on Epitaxial Growth-Principles and Applications, San Francisco Ca, Apr 05-08, 1999. WARRENDALE: MATERIALS RESEARCH SOCIETY. doi: 10.1557/PROC-570-175

Transmission electron microscopy study of InGaAs/GaAs structural evolution near the Stranski-Krastanow transformation

1999

Journal Article

Nonlinear optical properties of ion-implanted GaAs

Lederer, M. J., Luther-Davies, B., Tan, H. H., Jagadish, C., Haiml, M., Siegner, U., Keller, U. and Zou, J. (1999). Nonlinear optical properties of ion-implanted GaAs. Conference on Optoelectronic and Microelectronic Materials and Devices, Proceedings, COMMAD, 151-153.

Nonlinear optical properties of ion-implanted GaAs

1999

Journal Article

Ion irradiation of GeSi/Si strained-layer heterostructures

Glasko, J. M., Elliman, R. G., Zou, J., Cockayne, D. J.H. and Fitz Gerald, J. D. (1999). Ion irradiation of GeSi/Si strained-layer heterostructures. Materials Research Society Symposium - Proceedings, 540, 55-65.

Ion irradiation of GeSi/Si strained-layer heterostructures

1999

Journal Article

Defects formed during 1 MeV Si ion-irradiation of GeSi/Si strained-layer heterostructures at elevated temperatures

Glasko, J. M., Elliman, R. G., Zou, J., Cockayne, D. J.H. and Fitz Gerald, J. D. (1999). Defects formed during 1 MeV Si ion-irradiation of GeSi/Si strained-layer heterostructures at elevated temperatures. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 148 (1-4), 206-210. doi: 10.1016/S0168-583X(98)00887-8

Defects formed during 1 MeV Si ion-irradiation of GeSi/Si strained-layer heterostructures at elevated temperatures