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1995 Journal Article Ion damage buildup and amorphization processes in AlxGa1-xAsTan, H. H., Jagadish, C., Williams, J. S., Zou, J., Cockayne, D. J. H. and Sikorski, A. (1995). Ion damage buildup and amorphization processes in AlxGa1-xAs. Journal of Applied Physics, 77 (1), 87-94. doi: 10.1063/1.359358 |
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1995 Conference Publication Misfit dislocation generation from dissociated threading dislocations in strained-layer heterostructuresZou, J. and Cockayne, D. J. H. (1995). Misfit dislocation generation from dissociated threading dislocations in strained-layer heterostructures. 2nd International Conference on the Role of Interfaces in Advanced Materials Design, Processing and Performance, Ballarat, Australia, 1-5 November 1993. Switzerland, Germany: Trans Tech Publications. doi: 10.4028/www.scientific.net/MSF.189-190.279 |
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1994 Journal Article Misfit dislocations lying along 〈100〉 in [001] GaAs/In0.25Ga0.75As/GaAs quantum well heterostructuresZou, J, Chou, TC, Cockayne, Djh, Sikorski, A and Vaughan, MR (1994). Misfit dislocations lying along 〈100〉 in [001] GaAs/In0.25Ga0.75As/GaAs quantum well heterostructures. Applied Physics Letters, 65 (13), 1647-1649. doi: 10.1063/1.112938 |
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1994 Journal Article Glide of misfit dislocations through multi-layer heterostructuresZou, J. and Cockayne, D. J. H. (1994). Glide of misfit dislocations through multi-layer heterostructures. Physica Status Solidi A-applied Research, 145 (1), 133-143. doi: 10.1002/pssa.2211450112 |
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1994 Journal Article Precise determination of the periodicity for Mo/Si and W/C metallic multilayers by electron and x‐ray diffractionJiang, S. S., Zou, J., Cockayne, D. J. H., Hu, A. and Sikorski, A. (1994). Precise determination of the periodicity for Mo/Si and W/C metallic multilayers by electron and x‐ray diffraction. Journal of Applied Physics, 77 (1), 167-173. doi: 10.1063/1.359363 |
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1994 Journal Article Misfit-dislocation generation by dissociated dislocations in quantum-well heterostructuresZou, J. and Cockayne, D. J. H. (1994). Misfit-dislocation generation by dissociated dislocations in quantum-well heterostructures. Physical Review B, 49 (12), 8086-8095. doi: 10.1103/PhysRevB.49.8086 |
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1994 Conference Publication TEM studies of misfit dislocations in strained-layer heterostructuresZou, J and Cockayne, Djh (1994). TEM studies of misfit dislocations in strained-layer heterostructures. 13th International Congress on Electron Microscopy, Paris France, Jul 17-22, 1994. LES ULIS: MATERIALS RESEARCH SOCIETY. |
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1994 Journal Article The geometry of misfit dislocations with respect to the strained interface in [001] In0.1Ga0.9As/GaAs single heterostructuresZou, J, Cockayne, Djh and Jiang, SS (1994). The geometry of misfit dislocations with respect to the strained interface in [001] In0.1Ga0.9As/GaAs single heterostructures. Journal of Applied Physics, 75 (11), 7317-7322. doi: 10.1063/1.356642 |
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1993 Journal Article Growth direction dependence on strain relief by misfit dislocations in strained-layer heterostructuresZou, J. (1993). Growth direction dependence on strain relief by misfit dislocations in strained-layer heterostructures. Thin Solid Films, 235 (1-2), 6-9. doi: 10.1016/0040-6090(93)90230-M |
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1993 Journal Article Equilibrium dissociation configuration of misfit dislocations in low strained In0.1Ga0.9As/GaAs single heterostructuresZou, J. and Cockayne, D. J. H. (1993). Equilibrium dissociation configuration of misfit dislocations in low strained In0.1Ga0.9As/GaAs single heterostructures. Applied Physics Letters, 63 (16), 2222-2224. doi: 10.1063/1.110533 |
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1993 Journal Article Theoretical consideration of misfit dislocation nucleation by partial dislocations in [001] strained‐layer heterostructuresZou, J and Cockayne, Djh (1993). Theoretical consideration of misfit dislocation nucleation by partial dislocations in [001] strained‐layer heterostructures. Journal of Applied Physics, 74 (2), 925-930. doi: 10.1063/1.354860 |
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1993 Journal Article Misfit dislocations and critical thickness in InGaAs/GaAs heterostructure systemsZou, J, Cockayne, Djh and Usher, BF (1993). Misfit dislocations and critical thickness in InGaAs/GaAs heterostructure systems. Journal of Applied Physics, 73 (2), 619-626. doi: 10.1063/1.353372 |
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1992 Journal Article An electron diffraction and microscopy investigation of quasi-periodic Ta-Al superlatticesJiang, S. S., Zou, J., Cockayne, D. J. H., Sikorski, A., Hu, A and Peng, R. W. (1992). An electron diffraction and microscopy investigation of quasi-periodic Ta-Al superlattices. Philosophical Magazine B, 66 (2), 229-237. doi: 10.1080/13642819208224586 |
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1992 Journal Article Microstructural observations of Ta/Al superlattices by TEMJiang, SS, Zou, J, Cockayne, Djh, Sikorski, A, Hu, A and Peng, RW (1992). Microstructural observations of Ta/Al superlattices by TEM. Physica Status Solidi. A: Applications and Materials Science, 130 (2), 373-381. doi: 10.1002/pssa.2211300214 |
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1992 Journal Article Transmission electron microscopy investigations of misfit dislocation interactions in GaAs/InGaAs superlattices on GaAs (001) substratesJin, Zou, Shusheng, Jiang, Cockayne, D. J.H., Yunwu, Zhang, Xiang, Guo and Zhengfu, Peng (1992). Transmission electron microscopy investigations of misfit dislocation interactions in GaAs/InGaAs superlattices on GaAs (001) substrates. Chinese Physics Letters, 9 (7), 367-370. doi: 10.1088/0256-307x/9/7/009 |
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1991 Journal Article Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopyZou, J., Usher, B. F., Cockayne, D. J.H. and Glaisher, R. (1991). Critical thickness determination of InxGa1-xAs/GaAs strained-layer system by transmission electron microscopy. Journal of Electronic Materials, 20 (10), 855-859. |
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1988 Journal Article Twin structures, transformation and symmetry of superconducting Y1Ba2Cu3O7-x, observed by transmission electron microscopyZou, J., Cockayne, D. J. H., Auchterlonie, G. J., McKenzie, D. R., Dou, S. X., Bourdillon, A. J., Sorrell, C. C., Easterling, K. E. and Johnson, A. W. S. (1988). Twin structures, transformation and symmetry of superconducting Y1Ba2Cu3O7-x, observed by transmission electron microscopy. Philosophical Magazine Letters, 57 (3), 157-163. doi: 10.1080/09500838808203765 |
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1988 Journal Article A transmission electron-microscopy study on metastable phases in the li2o-tio2 systemZou, J., Li, F.H., Yang, D.Y., Jiang, Y.D. and Kuo, K.H. (1988). A transmission electron-microscopy study on metastable phases in the li2o-tio2 system. Philosophical Magazine B-physics of Condensed Matter Statistical Mechanics Electronic Optical And Magnetic Properties, 57 (1), 103-110. doi: 10.1080/13642818808205726 |
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1986 Journal Article Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+Tang, D., Teng, C.M., Zou, J. and Li, F. H. (1986). Pseudo-weak-phase-object approximation in high-resolution electron microscopy. II. Feasibility of directly observing Li+. Acta Crystallographica. Section B: Structural Science, 42 (4), 340-342. doi: 10.1107/S0108768186098130 |
