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2003

Conference Publication

Strain relaxation in self-assembled Ge(Si)/Si quantum dots

Zou, J., Liao, X. Z., Cockayne, D.J.H. and Jiang, Z. M. (2003). Strain relaxation in self-assembled Ge(Si)/Si quantum dots. Advanced Nanomaterials and Nanodevices, China, 10 - 14 June, 2002.

Strain relaxation in self-assembled Ge(Si)/Si quantum dots

2003

Conference Publication

Exploring Nanomaterials Using Advanced Transmission Electron Microscopy

Zou, J. (2003). Exploring Nanomaterials Using Advanced Transmission Electron Microscopy. Asia Pacific Nanotechnology Forum, Cairns, Australia, 19 - 21 November, 2003. N.J.: World Scientific.

Exploring Nanomaterials Using Advanced Transmission Electron Microscopy

2003

Conference Publication

Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands

Zou, Jin, Liao, Xiaozhou, Cockayne, David J. H. and Jiang, Zuimin (2003). Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands. Cambridge University Press. doi: 10.1017/S1431927603442360

Strain Relaxation Mechanisms in Coherent and Incoherent Ge(Si)/Si Islands

2003

Journal Article

Multilayered carbon films for tribological applications

McKenzie, DR, Tarrant, RN, Bilek, MMM, Ha, T, Zou, J, McBride, WE, Cockayne, DJH, Fujisawa, N, Swain, MV, James, NL, Woodard, JC and McCulloch, DG (2003). Multilayered carbon films for tribological applications. Diamond And Related Materials, 12 (2), 178-184. doi: 10.1016/S0925-9635(03)00020-7

Multilayered carbon films for tribological applications

2003

Book Chapter

Transmission electron microscopy investigation of semi conductor quantum dots

Zou, J. and Liao, X. Z. (2003). Transmission electron microscopy investigation of semi conductor quantum dots. 透射电子显微学进展. (pp. 552-574) edited by Hengqiang Ye and Yuanming Wang. Bejing, China: Science Press.

Transmission electron microscopy investigation of semi conductor quantum dots

2003

Conference Publication

TEM investigations of the compositions in Ge(Si)/Si(001) quantum dots

Liao, X. Z., Zou, J. and Cockayne, D. J. H. (2003). TEM investigations of the compositions in Ge(Si)/Si(001) quantum dots. VII InterAmerican Congress on Electron Microscopy, San Antonio, Texas, 3 - 7 August, 2003. New York, N.Y. U.S.A.: Microscopy Society of America. doi: 10.1017/s143192760344213x

TEM investigations of the compositions in Ge(Si)/Si(001) quantum dots

2002

Journal Article

Ion-beam-produced damage and its stability in AlN films

Kucheyev, SO, Williams, JS, Zou, J, Jagadish, C, Pophristic, M, Guo, S, Ferguson, IT and Manasreh, MO (2002). Ion-beam-produced damage and its stability in AlN films. Journal of Applied Physics, 92 (7), 3554-3558. doi: 10.1063/1.1501746

Ion-beam-produced damage and its stability in AlN films

2002

Journal Article

Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growth

Zou, J., Liao, X. Z., Cockayne, D. J. H. and Jiang, Z. M. (2002). Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growth. Applied Physics Letters, 81 (11), 1996-1998. doi: 10.1063/1.1506414

Alternative mechanism for misfit dislocation generation during high-temperature Ge(Si)/Si(001) island growth

2002

Journal Article

Structural disorder in ion-implanted AlxGa1-xN

Kucheyev, S. O., Williams, J. S., Zou, J., Li, G., Jagadish, C., Manasreh, M. O., Pophristic, M., Guo, S. and Ferguson, I. T. (2002). Structural disorder in ion-implanted AlxGa1-xN. Applied Physics Letters, 80 (5), 787-789. doi: 10.1063/1.1445478

Structural disorder in ion-implanted AlxGa1-xN

2002

Journal Article

Effect of ion species on implantation-produced disorder in GaN at liquid nitrogen temperature

Kucheyev, SO, Williams, JS, Zou, J, Li, G, Jagadish, C and Titov, AI (2002). Effect of ion species on implantation-produced disorder in GaN at liquid nitrogen temperature. Nuclear Instruments & Methods In Physics Research Section B-beam Interactions With Materials And Atoms, 190 (1-4), 782-786. doi: 10.1016/S0168-583X(01)01309-X

Effect of ion species on implantation-produced disorder in GaN at liquid nitrogen temperature

2002

Journal Article

Large-quantity production of high-yield boron nitride nanotubes

Chen, Y, Conway, M, Williams, JS and Zou, J (2002). Large-quantity production of high-yield boron nitride nanotubes. Journal of Materials Research, 17 (8), 1896-1899. doi: 10.1557/JMR.2002.0281

Large-quantity production of high-yield boron nitride nanotubes

2002

Conference Publication

Composition distributions in Ge(Si)/Si(001) quantum dots

Liao, X. Z., Zou, J. and Cockayne, David J. H. (2002). Composition distributions in Ge(Si)/Si(001) quantum dots. 15th International Congress on Electron Microscopy (ICEM), Durban, South Africa, 1-6 September, 2002.

Composition distributions in Ge(Si)/Si(001) quantum dots

2002

Journal Article

Dislocation-induced spatial ordering of InAs quantum dots: Effects on optical properties

Leon, R, Chaparro, S, Johnson, SR, Navarro, C, Jin, X, Zhang, YH, Siegert, J, Marcinkevicius, S, Liao, XZ and Zou, J (2002). Dislocation-induced spatial ordering of InAs quantum dots: Effects on optical properties. Journal of Applied Physics, 91 (9), 5826-5830. doi: 10.1063/1.1467963

Dislocation-induced spatial ordering of InAs quantum dots: Effects on optical properties

2002

Conference Publication

314 HRTEM Studies of Plastic Deformation in Silicon Wafers due to Micro Indentation

Zarudi, I., Zou, J. and Zhang, L (2002). 314 HRTEM Studies of Plastic Deformation in Silicon Wafers due to Micro Indentation. Materials Processing, Honolulu, Hawaii, 14 - 18 October, 2002.

314 HRTEM Studies of Plastic Deformation in Silicon Wafers due to Micro Indentation

2002

Conference Publication

Growth and characterization of GaAsN epilayer and (In)GaAsN qutantum-well structure

Gao, Q., Tan, H. H., Jagadish, C., Sun, B. Q., Gal, M., Ouyang, L. and Zou, J. (2002). Growth and characterization of GaAsN epilayer and (In)GaAsN qutantum-well structure. Optoelectronic and Microelecttronic Materials and Devices, University of Sydney, NSW, Australia, 11 - 13 December, 2002. NEW YORK: Institute of Electrical and Electronics Engineers. doi: 10.1109/COMMAD.2002.1237238

Growth and characterization of GaAsN epilayer and (In)GaAsN qutantum-well structure

2002

Journal Article

Blistering of H-implanted GaN

Kucheyev, SO, Williams, JS, Jagadish, C, Zou, J and Li, G (2002). Blistering of H-implanted GaN. Journal of Applied Physics, 91 (6), 3928-3930. doi: 10.1063/1.1430533

Blistering of H-implanted GaN

2002

Journal Article

Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imaging

Cai, DQ, Zou, J, Chen, GB, Lu, W, Chen, XS and Ringer, SP (2002). Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imaging. Scripta Materialia, 47 (4), 279-283. doi: 10.1016/S1359-6462(02)00144-6

Determination of Al compositional profiles across AlAs/GaAs heterostructural interface at sub-nanometer spatial resolution by thickness fringe imaging

2002

Conference Publication

Formation of misfit dislocations form island surface in Ge(Si)/Si quantum dots

Zou, J. (2002). Formation of misfit dislocations form island surface in Ge(Si)/Si quantum dots. COMMAD 2002, Sydney, Australia, 11-13 December, 2002. Piscataway: IEEE.

Formation of misfit dislocations form island surface in Ge(Si)/Si quantum dots

2002

Journal Article

Alloying, elemental enrichment, and interdiffusion during the growth of Ge(Si)/Si(001) quantum dots

Liao, X. Z., Zou, J., Cockayne, D. J. H., Wan, J., Jiang, Z. M., Jin, G. and Wang, K. L. (2002). Alloying, elemental enrichment, and interdiffusion during the growth of Ge(Si)/Si(001) quantum dots. Physical Review B, 65 (15), 153306 - 1-153306 - 4. doi: 10.1103/PhysRevB.65.153306

Alloying, elemental enrichment, and interdiffusion during the growth of Ge(Si)/Si(001) quantum dots

2002

Conference Publication

Strain relaxation in self-assembled Ge(Si)/Si quantum dots

Zou, J., Liao, X. Z. and Cockayne, D. J. H. (2002). Strain relaxation in self-assembled Ge(Si)/Si quantum dots. 15th International Congress on Electron Microscopy, Durban, South Africa, 1-6 September 2002. Onderstepoort, South Africa: Microscopy Society of Southern Africa.

Strain relaxation in self-assembled Ge(Si)/Si quantum dots