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2015 Journal Article Dean-flow-coupled elasto-inertial three-dimensional particle focusing under viscoelastic flow in a straight channel with asymmetrical expansion-contraction cavity arraysYuan, D., Zhang, J., Yan, S., Pan, C., Alici, G., Nguyen, N. T. and Li, W. H. (2015). Dean-flow-coupled elasto-inertial three-dimensional particle focusing under viscoelastic flow in a straight channel with asymmetrical expansion-contraction cavity arrays. Biomicrofluidics, 9 (4) 044108, 044108. doi: 10.1063/1.4927494 |
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2014 Journal Article High speed scanning for dynamic atomic force microscope based on higher-order resonance of silicon cantileverHuang, Qiang-Xian, You, Huan-Jie, Yuan, Dan, Zhao, Yang and Hu, Xiao-Juan (2014). High speed scanning for dynamic atomic force microscope based on higher-order resonance of silicon cantilever. Guangxue Jingmi Gongcheng/Optics and Precision Engineering, 22 (3), 656-663. doi: 10.3788/OPE.20142203.0656 |
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2013 Conference Publication Characteristics of the higher-order resonant cantilever in dynamic atomic force microscopyZhao, Yang, Huang, Qiang-Xian, Yuan, Dan, You, Huan-Jie and Xie, Hong (2013). Characteristics of the higher-order resonant cantilever in dynamic atomic force microscopy. 6th International Symposium on Precision Mechanical Measurements (ISPMM), Guiyang Peoples R China, Aug 08-12, 2013. BELLINGHAM: SPIE-INT SOC OPTICAL ENGINEERING. doi: 10.1117/12.2035924 |
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2013 Journal Article Research and experiment on higher-order resonance characteristic of dynamic AFM cantileverHuang, Qiangxian, Yuan, Dan, You, Huanjie, Zhao, Yang and Cheng, Zhenying (2013). Research and experiment on higher-order resonance characteristic of dynamic AFM cantilever. Yi Qi Yi Biao Xue Bao/Chinese Journal of Scientific Instrument, 34 (12), 2647-2652. |
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2012 Journal Article Calibration and uncertainty estimation of one-dimensional reference grating using a metrological atomic force microscopeHuang, Qiangxian, Yuan, Dan and You, Huanjie (2012). Calibration and uncertainty estimation of one-dimensional reference grating using a metrological atomic force microscope. Zhongguo Jixie Gongcheng/China Mechanical Engineering, 23 (5), 531-536. doi: 10.3969/j.issn.1004-132X.2012.05.005 |
